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description new applications for linear output hall-effect sensors, such as displacement and angular position, require higher accuracy and smaller package sizes. the allegro A1388 and a1389 linear hall-effect sensor ics have been designed specifically to meet both requirements. these temperature-stable devices are available in both surface-mount and through hole packages. the accuracy of each device is enhanced via end-of-line optimization. each device features non-volatile memory to optimize device sensitivity and the quiescent voltage output (qvo: output in the absence of a magnetic field) for a given application or circuit. this A1388 and a1389 optimized performance is sustained across the full operating temperature range by programming the temperature coefficient for both sensitivity and qvo at allegro end-of-line test. these ratiometric hall-effect sensor ics provide a voltage output that is proportional to the applied magnetic field. the quiescent voltage output is adjusted around 50% of the supply voltage. the features of these linear devices make them ideal for use in automotive and industrial applications requiring high accuracy, and they operate across an extended temperature range, C40c to 150c. each bicmos monolithic circuit integrates a hall element, temperature-compensating circuitry to reduce the intrinsic A13889-ds, rev. 1 features and benefits ? 5.0 v supply operation ? qvo temperat ure coefficient programmed at allegro ? for improved accuracy ? miniature pack age options ? high bandwidt h, low noise analog output ? high speed cho pping scheme minimizes qvo drift across operating temperature range ? t emperature-stable quiescent voltage output and sensitivity ? precise recove rability after temperature cycling ? output voltage clamps provide short circuit diagnostic capabilities ? undervoltage l ockout (uvlo) ? w ide ambient temperature range: C40c to 150c ? immune to me chanical stress ? enhanced emc performance f or stringent automotive applications linear hall-effect sensor ics with analog output available in a miniature, low profile surface mount package continued on the next page functional block diagram A1388 and a1389 v+ offse t and offse t tc sensitiv it y and dynamic offset cancellation tuned filter sensitivity t c vcc c bypass gnd vout packages approximate footprint 3-pin sot23-w 2 mm 3 mm 1 mm (suffix lh) 3-pin ultramini sip 1.5 mm 4 mm 3 mm (suffix ua)
2 description (continued) absolute maximum ratings characteristic symbol notes rating unit forward supply voltage v cc 8 v reverse supply voltage v rcc C0.1 v forward output voltage v out 7 v reverse output voltage v rout C0.1 v output source current i out(source) vout to gnd 2 ma output sink current i out(sink) vcc to vout 10 ma operating ambient temperature t a range l C40 to 150 oc maximum junction temperature t j (max) 165 oc storage temperature t stg C65 to 170 oc selection guide part number output polarity sensitivity (typ) (mv/g) packing* package A1388llhlx-2-t forward 2.5 10,000 pieces per reel 3-pin sot-23w surface mount A1388lua-2-t forward 2.5 500 pieces per bag 3-pin sip through hole a1389llhlx-9-t forward 9 10,000 pieces per reel 3-pin sot-23w surface mount a1389lua-9-t forward 9 500 pieces per bag 3-pin sip through hole a1389llhlx-rp9-t reverse C9 10,000 pieces per reel 3-pin sot-23w surface mount *contact allegro ? for additional packing options sensitivity drift of the hall element, a small-signal high-gain amplifier, a clamped low-impedance output stage, and a proprietary dynamic offset cancellation technique. the A1388 and a1389 sensor ics are are offered in two package styles. the lh is a sot-23w style, miniature, low profile package for surface-mount applications. the ua is a 3-pin, ultra-mini, single inline package (sip) for through-hole mounting. both packages are lead (pb) free, with 100% matte tin leadframe plating. linear hall-effect sensor ics with analog output available in a miniature, low profile surface mount package A1388 and a1389 allegro microsystems, llc 115 northeast cutoff worcester, massachusetts 01615-0036 u.s.a. 1.508.853.5000; www.allegromicro.com
3 pin-out diagrams 2 1 3 2 3 1 thermal characteristics may require derating at maximum conditions, see application information characteristic symbol test conditions value units package thermal resistance r ja package lh, 1-layer pcb with copper limited to solder pads 228 oc/w package lh, 2-layer pcb with 0.463 in. 2 of copper area each side connected by thermal vias 110 oc/w package ua, 1-layer pcb with copper limited to solder pads 165 oc/w terminal list table name number description lh ua vcc 1 1 input power supply; tie to gnd with bypass capacitor vout 2 3 output signal gnd 3 2 ground lh package ua package linear hall-effect sensor ics with analog output available in a miniature, low profile surface mount package A1388 and a1389 allegro microsystems, llc 115 northeast cutoff worcester, massachusetts 01615-0036 u.s.a. 1.508.853.5000; www.allegromicro.com
4 operating characteristics valid through t a , c bypass = 0.1 f, v cc = 5 v; unless otherwise noted characteristics symbol test conditions min. typ. max. unit 1 continued on the next page electrical characteristics supply voltage v cc 4.5 5.0 5.5 v undervoltage threshold 2 v uvlohi tested at t a = 25c and t a = 150c (device powers on) C C 3 v v uvlolo tested at t a = 25c and t a = 150c (device powers off) 2.5 C C v supply current i cc no load on vout C 9 11.5 ma power on time 3,4 t po t a = 25c, c l(probe) = 10 pf C 50 C s v cc ramp time 3,4 t vcc t a = 25c 0.005 C 100 ms v cc off level 3,4 v ccoff t a = 25c 0 C 0.55 v delay to clamp 3,4 t clp t a = 25c, c l = 10 nf C 30 C s supply zener clamp voltage v z t a = 25c, i cc = 14.5 ma 6 7.3 C v internal bandwidth 3 bw i small signal C3 db C 20 C khz chopping frequency 3,5 f c t a = 25c C 400 C khz output characteristics output referred noise 3 v n v cc = 5 v, t a = 25c, c bypass = open, sens = 9 mv/g, no load on vout C 15 C mv (p-p) input referred rms noise density 3 v nrms v cc = 5 v, t a = 25c, c bypass = open, sens = 9 mv/g, no load on vout, f measured << bwi C 1.5 C mg/hz dc output resistance 3 r out C <1 C output load resistance 3 r l vout to gnd 4.7 C C k output load capacitance 3 c l vout to gnd C C 10 nf output voltage clamp 6 v clphigh t a = 25c, b = +400 g, r l ?=?10?k?(vout ? to ? gnd) 4.35 4.5 4.65 v v clplow t a = 25c, b = C400 g, r l ?=?10?k?(vout?to ? vcc) 0.40 0.55 0.70 v sensitivity sens A1388llhlx-2-t t a = 25c 2.4 2.5 2.6 mv/g A1388lua-2-t 2.4 2.5 2.6 mv/g a1389llhlx-9-t 8.73 9 9.27 mv/g a1389lua-9-t 8.73 9 9.27 mv/g a1389llhlx-rp9-t C9.27 C9 C8.73 mv/g quiescent voltage output (qvo) v out(q) A1388llhlx-2-t t a = 25c 2.488 2.5 2.512 v A1388lua-2-t 2.488 2.5 2.512 v a1389llhlx-9-t 2.488 2.5 2.512 v a1389lua-9-t 2.488 2.5 2.512 v a1389llhlx-rp9-t 2.488 2.5 2.512 v sensitivity temperature coefficient tc sens programmed at t a = 150c, calculated relative to sens at 25c 0.08 0.12 0.16 %/c linear hall-effect sensor ics with analog output available in a miniature, low profile surface mount package A1388 and a1389 allegro microsystems, llc 115 northeast cutoff worcester, massachusetts 01615-0036 u.s.a. 1.508.853.5000; www.allegromicro.com
5 operating characteristics (continued) valid through t a , c bypass = 0.1 f, v cc = 5 v; unless otherwise noted characteristics symbol test conditions min. typ. max. unit 1 error components linearity sensitivity error lin err C 1.5 C % symmetry sensitivity error sym err C 1.5 C % ratiometry quiescent voltage output error 7 rat vout(q) across supply voltage range (relative to v cc = 5 v) C 1.5 C % ratiometry sensitivity error 7 rat sens across supply voltage range (relative to v cc = 5 v) C 1.5 C % ratiometry clamp error 8 rat voutclp t a = 25c, across supply voltage range (relative to v cc = 5 v) C 1.5 C % drift characteristics typical quiescent voltage output drift across temperature range ?v out(q) A1388llhlx-2-t t a = 150c C20 C 0 mv A1388lua-2-t C10 0 10 mv a1389llhlx-9-t C30 C 0 mv a1389lua-9-t C20 0 10 mv a1389llhlx-rp9-t C30 C 0 mv sensitivity drift due to package hysteresis 9 ?sens pkg A1388llhlx-2-t t a = 25c, after temperature cycling 0.08 0.12 0.16 % A1388lua-2-t 0.08 0.12 0.16 % a1389llhlx-9-t 0.08 0.12 0.16 % a1389lua-9-t 0.08 0.12 0.16 % a1389llhlx-rp9-t 0.08 0.12 0.16 % 1 1 g (gauss) = 0.1 mt (millitesla), 2 on power-up, the output of the device is held low until v cc exceeds v uvlohi . after the device is powered, the output remains valid until v cc drops below v uvlolo , when the output is pulled low . 3 determined by design and characterization, not evaluated at final test. 4 see the characteristic definitions section. 5 f c varies as much as approximately 20% across the full operating ambient temperature range and process. 6 v clplow and v clphigh scale with v cc due to ratiometry. 7 percent change from actual value at v cc = 5 v, for a given temperature. 8 percent change from actual value at v cc = 5 v, t a = 25c. 9 sensitivity ? drift ? through ? the ? life ? of ? the ? part, ? sens life , can have a typical error value 3% in addition to package hysteresis effects. linear hall-effect sensor ics with analog output available in a miniature, low profile surface mount package A1388 and a1389 allegro microsystems, llc 115 northeast cutoff worcester, massachusetts 01615-0036 u.s.a. 1.508.853.5000; www.allegromicro.com
6 characteristic definitions power on time when the supply is ramped to its operating voltage, the device output requires a finite time to react to an input magnetic field. power on time, t po , is defined as the time it takes for the output voltage to begin responding to an applied magnetic field after the power supply has reached its minimum specified operating voltage, v cc (min), as shown in figure 1. delay to clamp a large magnetic input step may cause the clamp to overshoot its steady state value. the delay to clamp, t clp , is defined as the time it takes for the output voltage to settle within 1% of its steady state value, after initially passing through its steady state voltage, as shown in figure 2. quiescent v oltage output in the quiescent state (no signifi- cant magnetic field: b = 0 g), the output, v out(q) , is at a con- stant ratio to the supply voltage, v cc , across the entire operating ranges of v cc and operating ambient temperature, t a . quiescent voltage output drift across temperature range due to internal component tolerances and thermal considerations, the quiescent voltage output, v out(q) , may drift due to temperature changes within the operating ambient temperature, t a . for purposes of specification, the quiescent voltage output drift across temperature range, ?v out(q) (mv), is defined as: ?v out(q) v out(q)(ta) ?v out(q)(25c) = (1) sensitivity the amount of the output voltage change is propor- tional to the magnitude and polarity of the magnetic field applied. this proportionality is specified as the magnetic sensitivity, sens (mv/g), of the device and is defined as: v out(b+) ? v out(b?) (b+) ? (b?) sens = (2) where b+ is the magnetic flux density in a positive field (south polarity) and bC is the magnetic flux density in a negative field (north polarity). sensitivity temperature coefficient the device sensitivity changes as temperature changes, with respect to its sensitivity temperature coefficient, tc sens . tc sens is programmed at 150c, and calculated relative to the baseline sensitivity program - ming temperature of 25c. tc sens is defined as: sens t2 ? sens t1 sens t1 t2?t 1 1 tc sens = 100 (%/c ) ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? (3) where t1 is the baseline sens programming temperature of 25c, and t2 is the tc sens programming temperature of 150c. the ideal value of sens across the full ambient temperature range, sens ideal(ta) , is defined as: sens t1 [100 (%) + tc sens (t a ?t1 )] sens ideal(ta) = (4) sensitivity drift across temperature range second order sensitivity temperature coefficient effects cause the magnetic sensitivity, sens, to drift from its ideal value across the operating ambient temperature range, t a . for purposes of specification, the sensitivity drift across temperature range, ?sens tc , is v +t v cc v cc (min) v out 90% v out 0 t 1 = time at which power supply reaches minimum specified operating voltage t 2 = time at which output voltage settles within 10% of its steady state value under an applied magnetic field t 1 t 2 t po v cc (typ) time (s) magnetic input signal magnetic input signal t 1 = time at which output voltage initially reaches steady state clamp voltage t 2 = time at which output voltage settles to within 1% of steady state clamp voltage v clphigh t 1 t 2 t clp v out device output, v out (v) figure 1. definition of power on time, t po figure 2. definition of delay to clamp, t clp linear hall-effect sensor ics with analog output available in a miniature, low profile surface mount package A1388 and a1389 allegro microsystems, llc 115 northeast cutoff worcester, massachusetts 01615-0036 u.s.a. 1.508.853.5000; www.allegromicro.com
7 defined as: sens ta ? sens ideal(ta) sens ideal(ta) ?sens tc = 100 (%) (5) sensitivity drift due to package hysteresis package stress and relaxation can cause the device sensitivity at t a = 25c to change during and after temperature cycling. this change in sensitivity follows a hysteresis curve. for purposes of specifica- tion, the sensitivity drift due to package hysteresis, ?sens pkg , is defined as: sens (25c)(2) ? sens (25c)(1) sens (25c)(1) ?sens pkg = 100 (%) (6) where sens (25c)(1) is the programmed value of sensitivity at t a = 25c, and sens (25c)(2) is the value of sensitivity at t a = 25c after temperature cycling t a up to 150c, down to C40c, and back to up 25c. linearity sensitivity error the A1388 and a1389 are designed to provide linear output in response to a ramping applied magnetic field. consider two magnetic fields, b1 and b2. ideally, the sensitivity of a device is the same for both fields, for a given supply voltage and temperature. linearity error is present when there is a difference between the sensitivities measured at b1 and b2. linearity sensitivity error, lin err , is calculated separately for positive (lin err+ ) and negative (lin errC ) applied magnetic fields. lin err (%) is measured and defined as: sens (b+)(2) sens (b+)(1) sens (b?)(2) sens (b?)(1) 1? lin err+ = 100 (%) 100 (%) ? ? ? ? ? ? ? ? 1? lin err? = ? ? ? ? ? ? ? ? (7) where: |v out(bx) ? v out(q) | b x sens bx = (8) and bx are positive and negative magnetic fields, with respect to the quiescent voltage output, such that |b (+)(2) | > |b (+)(1) | and |b (C)(2) | > |b (C)(1) | the effective linearity error is: max(|lin err+ | , |lin err? |) lin err = (9) the output voltage clamps, v clphigh and v clplow , limit the operating magnetic range of the applied field in which the device provides a linear output. the maximum positive and negative applied magnetic fields in the operating range can be calculated: v clphigh ? v out(q) sens ? b max(+) ? = v out(q) ? v clplow sens ? b max(?) ? = (10) symmetry sensitivity error the magnetic sensitivity of the device is constant for any two applied magnetic fields of equal magnitude and opposite polarities. symmetry error, sym err (%), is measured and defined as: sens (b+) sens (b?) 1? sym err = 100 (%) ? ? ? ? ? ? ? ? (11) where sens bx is as defined in equation 10, and b+ and bC are positive and negative magnetic fields such that |b+| = |bC|. ratiometry error the A1388 and a1389 provide ratiometric output. this means that the quiescent voltage output, v out(q) , magnetic sensitivity, sens, and clamp voltages, v clphigh and v clplow , are proportional to the supply voltage, v cc . in other words, when the supply voltage increases or decreases by a certain percentage, each characteristic also increases or decreases by the same percentage. error is the difference between the measured change in the supply voltage relative to 5 v, and the measured change in each characteristic. the ratiometric error in quiescent voltage output, rat vout(q) (%), for a given supply voltage, v cc , is defined as: v out(q)(vcc) / v out(q)(5v) v cc / 5 (v) 1? rat vout(q) = 100 (%) ? ? ? ? ? ? ? ? (12) the ratiometric error in magnetic sensitivity, rat sens (%), for a given supply voltage, v cc , is defined as: sens (vcc) / sens (5v) v cc / 5 (v) 1? rat sens = 100 (%) ? ? ? ? ? ? ? ? (13) the ratiometric error in the clamp voltages, rat voutclp (%), for a given supply voltage, v cc , is defined as: v clp(vcc) / v clp(5v) v cc / 5 (v) 1? rat voutclp = 100 (%) ? ? ? ? ? ? ? ? (14) where v clp is either v clphigh or v clplow . linear hall-effect sensor ics with analog output available in a miniature, low profile surface mount package A1388 and a1389 allegro microsystems, llc 115 northeast cutoff worcester, massachusetts 01615-0036 u.s.a. 1.508.853.5000; www.allegromicro.com
8 undervoltage lockout the A1388 and a1389 provide an undervoltage lockout feature which ensures that the device out- puts a vout signal only when v cc is above certain thresholds . the undervoltage lockout feature provides a hysteresis of opera- tion to eliminate indeterminate output states. the output of the A1388 and a1389 is held low (gnd) until v cc exceeds v uvlohi . after v cc exceeds v uvlohi , the device vout output is enabled, providing a ratiometric output voltage that is proportional to the input magnetic signal and v cc . if v cc should drop back down below v uvlolo for longer than t uvlo after the device is powered up, the output would be pulled low (see figure 3) until v uvlohi is reached again and vout would be reenabled. v cc ramp time the time taken for v cc to ramp from 0 v to v cc (typ). 5.0 v (see figure 4). v cc off level for applications in which the vcc pin of the A1388 or a1389 is being power-cycled (for example using a multiplexer to toggle the part on and off), the specification of v cc off level, v ccoff , determines how high a v cc off voltage can be tolerated while still ensuring proper operation and startup of the device (see figure 4). figure 3. definition of undervoltage lockout v out t uvlo v cc v uvlohi v uvlolo time time v cc (typ) v ccoff 0 t vcc supply voltage, v cc (v) figure 4. definition of v cc ramp time, t vcc linear hall-effect sensor ics with analog output available in a miniature, low profile surface mount package A1388 and a1389 allegro microsystems, llc 115 northeast cutoff worcester, massachusetts 01615-0036 u.s.a. 1.508.853.5000; www.allegromicro.com
9 A1388 a1389 vout gnd 0.1 5 v f r l vcc 4.7 nf application information figure 5. typical application circuit figure 6. chopper stabilization technique chopper stabilization technique when using hall-effect technology, a limiting factor for switchpoint accuracy is the small signal voltage developed across the hall element. this voltage is disproportionally small relative to the offset that can be produced at the output of the hall sensor ic. this makes it difficult to process the signal while maintain- ing an accurate, reliable output over the specified operating temperature and voltage ranges. chopper stabilization is a unique approach used to minimize hall offset on the chip. allegro employs a patented technique to remove key sources of the out- put drift induced by thermal and mechanical stresses. this offset reduction technique is based on a signal modulation-demodula- tion process. the undesired offset signal is separated from the magnetic field-induced signal in the frequency domain, through modulation. the subsequent demodulation acts as a modulation process for the offset, causing the magnetic field-induced signal to recover its original spectrum at base band, while the dc offset becomes a high-frequency signal. the magnetic-sourced signal then can pass through a low-pass filter, while the modulated dc offset is suppressed. in addition to the removal of the thermal and mechanical stress related offset, this novel technique also reduces the amount of thermal noise in the hall sensor ic while com- pletely removing the modulated residue resulting from the chop- per operation. the chopper stabilization technique uses a high frequency sampling clock. for demodulation process, a sample and hold technique is used. this high-frequency operation allows a greater sampling rate, which results in higher accuracy and faster signal-processing capability. this approach desensitizes the chip to the effects of thermal and mechanical stresses, and produces devices that have extremely stable quiescent hall output voltages and precise recoverability after temperature cycling. this technique is made possible through the use of a bicmos process, which allows the use of low-offset, low-noise amplifiers in combination with high-density logic integration and sample- and-hold circuits. am p r egu la to r clock/logic ha ll e lement tuned filter anti-aliasing lp filter linear hall-effect sensor ics with analog output available in a miniature, low profile surface mount package A1388 and a1389 allegro microsystems, llc 115 northeast cutoff worcester, massachusetts 01615-0036 u.s.a. 1.508.853.5000; www.allegromicro.com
10 package lh, 3-pin (sot-23w) 0.55 ref gauge plane seating plane 0.25 bsc 0.95 bsc 0.95 1.00 0.70 2.40 2 1 a active area depth, 0.28 mm ref b c c b reference land pattern layout all pads a minimum of 0.20 mm from all adjacent pads; adjust as necessary to meet application process requirements and pcb layout tolerances branding scale and appearance at supplier discretion a pcb layout reference view branding reference view branded face 2.90 +0.10 ?0.20 44 8x 10 ref 0.180 +0.020 ?0.053 0.05 +0.10 ?0.05 0.25 min 1.91 +0.19 ?0.06 2.98 +0.12 ?0.08 1.00 0.13 1 389 1 89r 0.40 0.10 for reference only; not for tooling use (reference dwg-2840) dimensions in millimeters dimensions exclusive of mold flash, gate burrs, and dambar protrusions exact case and lead configuration at supplier discretion within limits shown d hall element, not to scale a1389llhlx-9-t A1388llhlx-2-t a1389llhlx-rp9-t d d d 1.49 0.96 3 linear hall-effect sensor ics with analog output available in a miniature, low profile surface mount package A1388 and a1389 allegro microsystems, llc 115 northeast cutoff worcester, massachusetts 01615-0036 u.s.a. 1.508.853.5000; www.allegromicro.com
11 package ua, 3-pin sip 2 3 1 1.27 nom 1.02 max 45 45 c 1.52 0.05 b gate and tie bar burr area a b c dambar removal protrusion (6x) a d e e e 1.44 2.04 e active area depth, 0.50 mm ref branding scale and appearance at supplier discretion hall element (not to scale) for reference only; not for tooling use (reference dwg-9065) dimensions in millimeters dimensions exclusive of mold flash, gate burrs, and dambar protrusions exact case and lead configuration at supplier discretion within limits shown mold ejector pin indent d standard branding reference view = supplier emblem n = last three digits of device part number nnn 1 0.41 +0.03 ?0.06 0.43 +0.05 ?0.07 14.99 0.25 4.09 +0.08 ?0.05 3.02 +0.08 ?0.05 0.79 ref 10 branded face linear hall-effect sensor ics with analog output available in a miniature, low profile surface mount package A1388 and a1389 allegro microsystems, llc 115 northeast cutoff worcester, massachusetts 01615-0036 u.s.a. 1.508.853.5000; www.allegromicro.com
12 copyright ?2009-2014, allegro microsystems, llc allegro microsystems, llc reserves the right to make, from time to time, such departures from the detail specifications as may be required to permit improvements in the performance, reliability, or manufacturability of its products. before placing an order, the user is cautioned to verify that the information being relied upon is current. allegros products are not to be used in any devices or systems, including but not limited to life support devices or systems, in which a failure of allegros product can reasonably be expected to cause bodily harm. the information included herein is believed to be accurate and reliable. however, allegro microsystems, llc assumes no responsibility for its use; nor for any infringement of patents or other rights of third parties which may result from its use. revision history revision revision date description of revision rev. 1 june 27, 2014 update product offerings linear hall-effect sensor ics with analog output available in a miniature, low profile surface mount package A1388 and a1389 allegro microsystems, llc 115 northeast cutoff worcester, massachusetts 01615-0036 u.s.a. 1.508.853.5000; www.allegromicro.com

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